Webinars

Failure Simulation

 Date: 21/2-18

Presenter: Digitaltest, Hans Baka

Description
Failure simulation is a way of ascertaining that you are testing your products correctly and obtaining an accurate result.

Precise Current Measurements

Date: 21/3-18

Presenter: Ridgetop, Hans Manhaeve

Description
Fast and highly repeatable precise current measurements are key to assuring reliable electronic circuits and systems.

INtuitive Test Interface

Date: 16/5-18

Presenter: Nexeya, Vincent Marie

Description
Customizable software for test engineers. Create your own, powerful test system interface without any programming. If used right it can (and will) make your job a lot easier.

PROCHEK CURRENT MEASUREMENTS

Date: May 23, 2018 10am-11am (UTC-7)

Presenter: Hans Manhaeve
Description
Rapid precision current measurements in IC production test can help reduce reliability risks and ensure reliably working circuits.

SOFTWARE CITE

Date: 4th OCtober 2018
Presenter: Digitaltest
Language: English
Description
In this webinar you will learn about easier program development and speedup of the test programs in CITE, the new C-LINK release 6.8 and how to take and store photos of defects in QMAN.

- CITE: easier program development and speedup of the test programs
- C-LINK: Release 6.8
- QMAN: take and store photos of defects (Fault Image Browser)

For the experienced DT user as well as for an insight DT software. 

Panel test

Date: 11th October 2018
Presenter: Digitaltest
Language: English
Description
In this webinar you will learn what solutions Digitaltest can offer regarding panel testing.

- Panels in general
- Advantages of panel test
- Challenges when testing panels
- Our solutions in preparation, test program creation & production

For the experienced DT user as well as for an insight Digitaltest solutions for panel test. 

ICT applications

Date: 18th October 2018
Presenter: Digitaltest
Language: English
Description
In this webinar you will learn practical tips and tricks from the application team of Digitaltest

-MUX09: new rev. D5
-AMU05: auto-calibration without INIT
- AMU05: SPS-Port GND-Pins
- Pin-Relays switching
- LED-chain: test with cc 50mA @ 30V
- Leakage-current measurement

flying probe

Date: 25th October 2018
Presenter: Digitaltest
Language: 
English
Description
In this webinar you will learn about the latest Condor flying probe innovations.

- New self-test and training board (STB01)
- Example test programs in VB6 and Mixed
- New camera framework 2.0
- THT contact optimized

For the experienced DT user as well as for an insight in Digitaltest Condor MTS505 flying prober.

stencil cleaning

Date: 19 October 2018
Presenter: Pär Gester
Language: Swedish / English
Description
SMT stencil cleaning is a critical process with many parameters to tweak and different choises of solvents and stencil roll materials.

Learn how to minimize your soldering defects by better cleaning in this webinar.

BGA Solutions

Date: ~14/11-18
Presenter:
Language: 
English
Description
TopLine BGA solutions for harsh environments:

CCGA - Column grid arrays
BGA coils - extreme durability
PID - antivibration solutions

Topic Pending

Date: ~12/12-18
Presenter:
Language: 
TBD
Description